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Performance of silicon drift detectors at LCLS

By G. Blaj, C. J. Kenney, S. Boutet, G. Carini, M. Chollet, G. Dakovski, G. Haller, P. Hart, S. Herrmann, J. Koglin, M. Messerschmidt, S. Nelson, J. Pines, S. Song, J. Thayer, A. Tomada, G. Williams

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Category

BioXFEL Publications

Published on

Type

proceedings-article

Author

G. Blaj and C. J. Kenney and S. Boutet and G. Carini and M. Chollet and G. Dakovski and G. Haller and P. Hart and S. Herrmann and J. Koglin and M. Messerschmidt and S. Nelson and J. Pines and S. Song and J. Thayer and A. Tomada and G. Williams

Citation

Blaj, G. et al., 2016. Performance of silicon drift detectors at LCLS. 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD). Available at: http://dx.doi.org/10.1109/nssmic.2016.8069827.

DOI

http://dx.doi.org/10.1109/nssmic.2016.8069827