Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): S. Gul, J. Hattne, P. H. Zwart, D. Difiore, M. M. Seibert, N. K. Sauter, A. Zouni, W. E. White, J. Yano, R. W. Grosse-Kunstleve, G. J. Williams, T. C. Weng, J. Kern, R. G. Sierra, D. Sokaras, A. Lampe, S. Boutet, J. E. Koglin, P. Glatzel, C. Glockner, M. J. Latimer, N. Echols, A. R. Fry, V. K. Yach, J. Sellberg, R. Tran, G. Han, S. Koroidov, J. Hellmich, R. Alonso-Mori, D. Milathianaki, P. D. Adams, B. Lassalle-Kaiser, M. J. Bogan, H. Laksmono, A. Miahnahri, U. Bergmann, J. Messinger, R. J. Gildea, D. W. Schafer, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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