Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): D. Milathianaki, J. Hellmich, P. D. Adams, U. Bergmann, M. J. Bogan, R. J. Gildea, H. Laksmono, B. Lassalle-Kaiser, P. H. Zwart, D. W. Schafer, A. Miahnahri, S. Gul, J. Messinger, D. Difiore, W. E. White, M. M. Seibert, R. W. Grosse-Kunstleve, J. Hattne, N. K. Sauter, J. Yano, R. G. Sierra, G. J. Williams, A. Zouni, T. C. Weng, P. Glatzel, D. Sokaras, A. Lampe, S. Boutet, J. Kern, V. K. Yach, M. J. Latimer, R. Tran, J. E. Koglin, N. Echols, C. Glockner, J. Sellberg, R. Alonso-Mori, G. Han, A. R. Fry, S. Koroidov, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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