Simultaneous femtosecond X-ray spectroscopy and diffraction of photosystem II at room temperature
25 Apr 2013 | Publications | Contributor(s): S. Gul, B. Lassalle-Kaiser, P. H. Zwart, M. J. Bogan, H. Laksmono, N. K. Sauter, J. Messinger, W. E. White, D. W. Schafer, R. W. Grosse-Kunstleve, A. Miahnahri, T. C. Weng, D. Difiore, R. G. Sierra, M. M. Seibert, J. Hattne, A. Zouni, P. Glatzel, J. Yano, G. J. Williams, S. Boutet, N. Echols, J. Kern, V. K. Yach, D. Sokaras, R. Tran, A. Lampe, S. Koroidov, C. Glockner, R. Alonso-Mori, M. J. Latimer, J. E. Koglin, P. D. Adams, J. Sellberg, G. Han, A. R. Fry, J. Hellmich, U. Bergmann, D. Milathianaki, R. J. Gildea, Mark Messerschmidt, Ranga Setlur
Intense femtosecond x-ray pulses produced at the Linac Coherent Light Source (LCLS) were used for simultaneous x-ray diffraction (XRD) and x-ray emission spectroscopy (XES) of microcrystals of …
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