2015 Serial Crystallography Data Analysis Workshop at ACA Annual Meeting.

By Nadia Zatsepin1, Tom Grant2

1. Arizona State University 2. Hauptman-Woodward Institute

Category

Workshops

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Abstract

We are running a serial femtosecond crystallography data analysis workshop at ACA 2015 in Philadelphia, PA, focused on "Serial Crystallography Data Analysis with Cheetah and CrystFEL: Concepts and Tutorials". 
www.amercrystalassn.org/2015-wk.02

See Series below to view videos and presentations from this workshop  

Workshop format:
The workshop will start with an introductory seminar, followed by most of the day dedicated to detailed hands-on tutorials with data sets collected at LCLS using the software suites Cheetah and CrystFEL, two of the most commonly used packages for SFX analysis. 
We will begin at 9 am and conclude at 5 pm. 
 
Workshop Schedule:


Target audience:

This workshop is intended for graduate students, postdocs and young scientists interested in the details of serial femtosecond crystallography data analysis. It is not intended as an introduction to crystallography. Participants will be assumed to have at least a 
basic knowledge of conventional crystallographic data analysis, as we will focus on the specific features of SFX analysis. Participants are strongly encouraged to obtain familiarity with Unix commands prior to attending. 

We will assume participants have some basic knowledge of conventional crystallographic data analysis such as what indexing, integration, and merging are and will instead focus on the specific features of serial crystallography analysis. Participants will also be expected to have familiarity with Unix commands. 
Practice data (from 
http://cxidb.org ) will be available, and participants are welcome to bring their own SFX data. 
Computing resources and temporary data storage space will be provided by LCLS, SLAC National Accelerator Laboratory. 
Students will be sent detailed information prior to the workshop to ensure they have an active Unix account at SLAC, and bring  bring laptops with appropriate software preinstalled.     The 2015 ACA meeting is an excellent opportunity and appropriate venue to bring together experts in serial crystallography data analysis with students and motivated young scientists interested in learning how to become successful in SFX data analysis. This workshop complements the ACA 2015 Session 2.2.1: Advances in serial crystallography and practical aspects of dealing with multiple crystals. 
This conference session, co-chaired by 2 of the workshop organizers, will provide an overview of XFEL SFX and its rapid development, recent implementations of serial crystallography at synchrotrons, dealing with practical and computations issues with data from multiple crystals, as well as some exciting recent biological results obtained with SFX. The workshop will provide hands-on training for the analysis of serial crystallographic data from "raw" data to a reflection list that can be used in further crystallographic analysis. 

  Registration:


The workshop has sold out. Please contact Kristina Vitale via kvitale@hwi.buffalo.edu to be put on a waiting list.


Registration was through the ACA website: 
www.amercrystalassn.org/2015-registrration
All participants must pre-register for the workshop and submit the following fee with their meeting registration form:
Student or Post-doc -  before May 31, $100, on or after June 1, $150
Academic others - before May 31, $150, on or after June 1, $200
Corporate - before May 31,  $250, on or after June 1, $300
Workshop fees cover the workshop, wifi, coffee/tea breaks, and lunch. 
Workshop fees can be waived for a limited number of students (sponsored by the National Science Foundation BioXFEL Science and Technology Center). You will need to apply for the stipend through the BioXFEL STC, by contacting Jill Szczesek at 
jszczesek@hwi.buffalo.edu
 

Credits

Guest speaker Thomas White, CFEL/DESY Organizers / instructors Nadia Zatsepin, ASU Thomas Grant, HWI Cornelius Gati, CFEL/DESY Marc Messerschmidt, HWI Eddie Snell, HWI  

Sponsored by

This workshop is supported by the NSF BioXFEL STC, Center for Free Electron Science (CFEL) at DESY, and SLAC National Accelerator Laboratory. 

Time

Location

Philadelphia, PA

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In This Workshop

  1. Recent Advances in SFX at BioXFEL

    25 Jul 2015 | Teaching Materials | Contributor(s): John Spence

    Dr. John Spence, Scientific Director for BioXFEL, discusses recent advances in the field of serial crystallography.

  2. SFX Data Reduction and Preprocessing with Cheetah

    25 Jul 2015 | Teaching Materials | Contributor(s): Nadia Zatsepin

    Dr. Nadia Zatsepin discusses how to use the software program Cheetah to reduce raw SFX data from LCLS to a set of crystal "hits".

  3. SFX Indexing and Integration with CrystFEL

    25 Jul 2015 | Teaching Materials

    Dr. Thomas White discusses how to index and integrate serial crystallography images using the CrystFEL software package.

  4. Introduction to serial femtosecond crystallography data analysis

    21 Jul 2015 | Series | Contributor(s): Nadia Zatsepin, Tom Grant

    Introduction to serial femtosecond crystallography (SFX) with X-ray free electron lasers.  Presentation on software for SFX. 

  5. LCLS serial femtosecond crystallography data analysis instructions

    21 Jul 2015 | Series | Contributor(s): Nadia Zatsepin

    SFX data analysis at LCLS Overview.

  6. Data Analysis Scripts

    21 Jul 2015 | Downloads

    A repository of useful scripts for the analysis of XFEL data.