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Analysis of XFEL serial diffraction data from individual crystalline fibrils

By David H. Wojtas, Kartik Ayyer, Mengning Liang, Estelle Mossou, Filippo Romoli, Carolin Seuring, Kenneth R. Beyerlein, Richard J. Bean, Andrew J. Morgan, Dominik Oberthuer, Holger Fleckenstein, Michael Heymann, Cornelius Gati, Oleksandr Yefanov, Miriam Barthelmess, Eirini Ornithopoulou, Lorenzo Galli, P. Lourdu Xavier, Wai Li Ling, Matthias Frank¹, Chun Hong Yoon, Thomas A. White, Saša Bajt, Anna Mitraki, Sebastien Boutet, Andrew Aquila, Anton Barty, V. Trevor Forsyth, Henry Chapman², Rick P. Millane

1. Lawrence Livermore National Laboratory 2. Center for Free-Electron Laser Science