Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): R. Hartmann, M. Barthelmess, J. Schulz, V. Elser, N. Kimmel, H. J. Tobias, F. R. Maia, B. Rudek, L. Gumprecht, S. W. Epp, D. Rolles, A. Rudenko, H. Graafsma, P. Holl, S. Bajt, M. J. Bogan, J. Ullrich, A. Aquila, G. R. Farquar, C. Reich, R. G. Sierra, L. Strueder, J. Bozek, T. Ekeberg, N. D. Loh, H. J. Park, E. Pedersoli, B. Erk, H. Soltau, S. Marchesini, L. Foucar, C. Y. Hampton, A. Hartmann, H. Fleckenstein, P. Bucksbaum, R. L. Shoeman, M. Hantke, J. Steinbrener, W. H. Benner, G. Hauser, C. Bostedt, L. Lomb, I. Schlichting, N. Coppola, D. Starodub, A. V. Martin, H. Hirsemann, S. Kassemeyer, M. Liang, K. Nass, C. Wunderer, A. Barty, G. Weidenspointner, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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