Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): S. W. Epp, A. Hartmann, M. Hantke, H. Fleckenstein, J. Steinbrener, C. Y. Hampton, P. Bucksbaum, S. Bajt, L. Lomb, G. Hauser, I. Schlichting, C. Bostedt, N. Coppola, R. G. Sierra, T. Ekeberg, A. V. Martin, M. Liang, H. Hirsemann, K. Nass, D. Starodub, S. Marchesini, M. Barthelmess, G. Weidenspointner, J. Schulz, C. Wunderer, N. Kimmel, A. Barty, R. L. Shoeman, W. H. Benner, F. R. Maia, B. Rudek, H. J. Tobias, L. Gumprecht, P. Holl, A. Rudenko, M. J. Bogan, H. Graafsma, J. Ullrich, D. Rolles, S. Kassemeyer, L. Strueder, G. R. Farquar, J. Bozek, C. Reich, N. D. Loh, A. Aquila, R. Hartmann, V. Elser, E. Pedersoli, H. Soltau, B. Erk, H. J. Park, L. Foucar, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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