Toward unsupervised single-shot diffractive imaging of heterogeneous particles using X-ray free-electron lasers
17 Nov 2013 | Publications | Contributor(s): H. Fleckenstein, K. Nass, C. Y. Hampton, A. Hartmann, M. Liang, S. Kassemeyer, C. Bostedt, N. Kimmel, M. Barthelmess, G. Hauser, J. Schulz, V. Elser, R. Hartmann, H. Hirsemann, L. Gumprecht, D. Starodub, A. V. Martin, S. W. Epp, J. Ullrich, C. Wunderer, P. Holl, A. Barty, M. J. Bogan, G. Weidenspointner, S. Bajt, B. Rudek, N. D. Loh, H. J. Tobias, L. Strueder, F. R. Maia, J. Bozek, T. Ekeberg, R. G. Sierra, H. Graafsma, L. Foucar, D. Rolles, H. Soltau, A. Rudenko, S. Marchesini, J. Steinbrener, C. Reich, P. Bucksbaum, A. Aquila, M. Hantke, G. R. Farquar, W. H. Benner, R. L. Shoeman, N. Coppola, H. J. Park, L. Lomb, E. Pedersoli, I. Schlichting, B. Erk, Henry Chapman, Matthias Frank, Stefan Hau-Riege, Mark S. Hunter
Single shot diffraction imaging experiments via X-ray free-electron lasers can generate as many as hundreds of thousands of diffraction patterns of scattering objects. Recovering the real space …
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